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Product features

• ? User friendly 7” color touch panel display
  
• ? Support multi-language & facilitate users
  
• ? Built-in environment self-test program
  
• ? Programmable operation
  
• ? Pre-programmed IEC standard test levels, easy to operate
  
• ? RS232/USB interface, PC control operation & printable test report
  
• ?

Product parameters

• Model
  

  Voltage variation range
  

  Voltage change duration
  

  Switching phase
  

  Built-in standard test level
  

  Fall/rise time
  

  Voltage changes in the number of repeats
  

  Interval cycle of voltage variation
  

  Voltage dips mode
  

  EUT capacity
  

  Power supply
  

  Ambient temperature
  

• VDT S20
  

  0~120%
  

  1~9999 half cycle (HC)
  

  0~359°synchronous, asynchronous, or automatic
  

  0%, 40%, 70%, 80%, 120%
  

  1μs~5μs for abrupt changes
  

  1~9999*9999
  

  1~9999 half cycle (HC)
  

  Freely set
  

  1 phase, 20A
  

  AC220V 50/60Hz
  

  15℃~35℃
  

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Single phase 6kV lightning surge generator sur S6

Model：SUR S6

The impact of lightning (indirect lightning) in nature and voltage changes caused by large switch switching in power supply lines on power supply lines and communication lines is particularly large, and the impact on products may be destructive. The lightning surge generator is used to evaluate the performance of the equipment when it is subjected to high-energy disturbance from the power line port and other signal line ports. The product meets the requirements of new standards such as iec61000-4-5 and gb/t17626.5.

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Capacitive coupling clamp

Model：EFT 4C

The capacitive coupling clamp can couple the fast transient pulse group to the tested line without any electrical connection with the terminal of the tested equipment port, cable shield or any other part of the tested equipment. The capacitive coupling clamp is used in conjunction with the electric fast transient pulse group generator to superimpose interference on the input, output, control line and data line of the equipment to conduct the system anti-interference test. Comply with the standard requirements of iec61000-4-4 and gb/t17626.4.

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